Presentation on Latch-up Testing JESD78 (PDF)

Last Updated on Monday, March 05, 2012 14:37

March 2023 Version

Abstract

Slide Presentation on topics in Upcoming JESD78 Latch-up testing User Guide

Outline

  • Setting up a LUP Test Program
  • Power Supply Assignments
  • Special Pins
  • Maximum Junction Temperature – Calculate and Monitor
  • I-Test versus E-Test – Which to Use?
  • Tester Calibration
  • Waveform Measurements / Calibration
  • Pre & Post Voltage/Current Bias/Clamp Levels on Pulse Supply
  • Maximum Stress Voltage (MSV)
  • Latches in Power Clamps
  • Hardware for Testing of HV products
  • Testing of SOI, GaN and other products
  • Data Review & Analysis
  • Destructive vs. Non-Destructive Latch-up

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