Tutorial on Charged Device Model Qualification Issues (PDF)

Last Updated on Monday, April 04, 2023

Abstract

• Since its first publication in 2009, JEP157 on CDM Target Levels has been a very popular and important reference to the industry for CDM ESD qualification • While all the technical information is still valid, perspectives have changed with special reference to advanced technologies for ultra high-speed applications • As such, this new revision focuses on relevant information that is up to date and details a better target level roadmap to meet these new applications • The document revision also adds new information on CDM qualification testing alignment and issues related to external IP interfaces • Addresses projected 3D IC CDM targets for the first time • While most of the document is intact it should be noted that some of the modifications required updating some of the original figures to be commensurate with the overall new message – old figures were replaced with more inclusive information dealing with newer technologies

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